GaN RF Device Characterization & Reliability Research (Italia)

GaN RF Device Characterization & Reliability Research (Italia)

03 ott
|
Italian Ministry of Education, University and Research
|
Italia

03 ott

Italian Ministry of Education, University and Research

Italia

pDipartimento di Ingegneria dell'Informazione - Università degli studi di Padova seeks a researcher to characterize GaN devices and develop related experimental setups. Responsibilities include studying degradation processes in GaN devices and contributing to advanced semiconductor research within a university setting. /ppThe appointment is part of a research initiative with eligibility for fellows under specified residence rules, offering an opportunity to work on cutting-edge GaN technology in a /p #J-18808-Ljbffr

📌 GaN RF Device Characterization & Reliability Research (Italia)
🏢 Italian Ministry of Education, University and Research
📍 Italia

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